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Fischerscope XDAL 237 X-Ray Spectrometer

Fischerscope XDAL 237 X-Ray Spectrometer

Specifications

  • Reference Number: 1700022
  • Make: Fischerscope
  • Model: XDAL
  • Vintage: 2012
  • Process Flow: ?
  • Hours: ?
  • Software: ?
  • X-Ray Fluorescence Spectrometer with a programmable X/Y-stage and Z-axis for automated measurements of thin coatings and for material analysis.
  • Vintage: 2012
  • Electrically changeable apertures and primary filters
  • Silicon PIN detector – high accuracy and good detection sensitivity
  • Analyzes Coating systems, solid samples, liquid samples.
  • Detects up 24 elements from Aluminum(13) to uranium (92) simultaneously
  • Areas of application:
  • Analysis of thin coatings
  • Measurement of functional coatings in teh electronics & semiconductor industry.
  • Determination of complex multi-coating sytems
  • automated measurements; i.e. in quality control
  • determination of the lead content in solder

Other Features:

  • Small footprint Bench-top unit
  • User Friendly
  • programmable X/Y stage
  • laser pointer for alignment
  • high resolution color video camera with powerful magnification
  • hand, joystick, or mouse operation
  • WinFTM Software
  • Micro focus tube with beryllium window
  • Adjustable voltage; 10kV, 30kV, 50kV
  • 4 standard apetures; .1mm, .3mm, .6mm, slot .5mm x .15mm
  • high-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis
  • Adjustable LED illumination of the measurement loaction
  • zoom factor: up to 180x (optical 20x…45x; digital 1x…4x)
  • Plastic brief case with manual, software, calibration standards, security key
  • Dell computer Monitor
  • Dell computer
    Table available

Product Category

Test and Inspection

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